Hardness Tester Accessories

Supplier & Manufacturer of Wide range for Testing & Measuring Equipments in NDT & DT field. We offer wide range of Impact Devices for Digital Portable hardness Tester.

Specification:

• Impact Device D
• Impact Device DC
• Impact Device C
• Impact Device G
• Impact Device DL
• Impact Device S
• Impact Device E

Leeb Hardness Test Blocks

We offer wide range of Test Block for Digital Portable Hardness Tester of all range and scale. We offer low, medium and high hardness test block with all scale Rockwell, Brinell and Vickers hardness tester.

Using the Genuine Leeb Scales (HL)

The Leeb rebound method was invented in 1975. Since then, Proceq has maintained the genuine Leeb standard HL. That means, a measurement of a sample showing a result of 750 HLD by Proceq in 1975, done with the first generation Equotip, would still deliver the exact same result today, done with the most recent generation. With Equotip test blocks, end users can check if their testers conform with this hardness unit, similarly to using a ruler for length measurements. During a Leeb hardness measurement, an impact body with a hard ball indenter is launched by spring energy against the sample, and then rebounds. The ratio of the rebound velocity vr to the impact velocity vi multiplied by 1000 yields the hardness value HL (Leeb hardness).

Digital Portable Leeb Hardness Testers provide accurate measurements if the impact body has a certain position in the guiding tube at the moment of its impact onto the test surface. When testing flat samples with standard support rings, the spherical test tip is located precisely at the end of the guiding tube. However, when testing curved samples with the standard support rings, this may not always be the case. To ensure accurate measurements in all cases, We offers a range of special support rings designed for measurements on curved sample surfaces.